An optical fiber-taper probe for wafer-scale microphotonic device characterization.
نویسندگان
چکیده
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3 x 10(6)) and a planar microring (Q = 4.8 x 10(6)).
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ورودعنوان ژورنال:
- Optics express
دوره 15 8 شماره
صفحات -
تاریخ انتشار 2007